Mechanistic Insights into Metal-Organic Framework Thin Film Growth from Microkinetic Analysis of in Situ X-Ray Scattering Data
Published in Matter, 2026
This work integrates in-situ scattering data with mechanistic modeling to explain how evaporation, temperature, and concentration shape MOF thin-film growth.
It highlights how real-time structural measurements can be translated into predictive growth models.
Recommended citation: Prem K. Reddy, Prince Verma, Ankit Dhakal, Rajan R. Bhawnani, Meagan Phister, Anish V. Dighe, Kevin H. Stone, Gaurav Giri, and Meenesh R. Singh. (2026). "Mechanistic Insights into Metal-Organic Framework Thin Film Growth from Microkinetic Analysis of in Situ X-Ray Scattering Data." Matter 9(1).